氧化辅助抛光在碳化硅零件超精密加工中的应用
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解放军理工大学野战工程学院

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TH164;TB332

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国家自然科学基金(51505498);江苏省自然科学基金(BK20150714)


Application of oxidation-assisted polishing in ultra-precision machining of Silicon Carbide parts
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College of Field Engineering,PLA University of Science and Technology,Nanjing

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    摘要:

    烧结碳化硅以其卓越的物理化学性能在工业领域中得到广泛应用,氧化辅助抛光是获得高精度碳化硅零件的重要加工技术。通过等离子体氧化、热氧化、电化学氧化在碳化硅基材上获得软质氧化层,利用软磨粒抛光实现氧化物的快速去除,有利于提高材料去除效率、提升加工表面质量。实验结果表明,通过等离子体氧化辅助抛光,表面粗糙度rms 和Ra分别达到0.626nm和0.480nm;通过热氧化辅助抛光,表面粗糙度rms和Ra分别达到0.920nm和0.726nm;在电化学氧化中,基于Deal-Grove模型计算得到的氧化速度为5.3nm/s,电化学氧化辅助抛光后的表面粗糙度rms和Ra分别是4.428nm和3.453nm。氧化辅助抛光有助于烧结碳化硅加工工艺水平的提升,促进碳化硅零件在光学、陶瓷等领域的应用。

    Abstract:

    Reaction-sintered silicon carbide (RS-SiC) has been widely used in the industrial fields for its excellent physical and chemical properties. Oxidation-assisted polishing is an important machining method for obtaining SiC parts with high precision. Through plasma oxidation, thermal oxidation, and anodic oxidation, soft oxide can be obtained on the RS-SiC substrate. With the assistance of abrasive polishing to remove the oxide rapidly, the material removal rate can be increased and the surface quality can be improved. The experimental results indicate that the surface roughness root-mean-square (rms) and roughness-average (Ra) can reach 0.626nm and 0.480nm by plasma oxidation-assisted polishing; in thermal oxidation-assisted polishing, the rms and Ra can be 0.920nm and 0.726nm; in anodic oxidation, the calculated oxidation rate is 5.3nm/s based on Deal-Grove model, and the rms and Ra is 4.428nm and 3.453nm in anodic oxidation-assisted polishing. The oxidation-assisted polishing can be propitious to improve the process level in machining RS-SiC, which would promote the application of SiC parts in optics and ceramics fields.

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  • 收稿日期:2015-12-10
  • 最后修改日期:2016-01-22
  • 录用日期:2023-08-21
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